Printable Electronics/Convertech Japan
Date : Feb 16, 2011 - Feb 18, 2011
Opening Hours : 10:00 - 17:00
Venue : East Exhibition Hall 6, Tokyo Big Sight
Location Address : Tokyo
Country : Japan
Organizer : Converting Technical Institute
Show URL : http://www.printable-electronics.com/eng/index.html
Number of exhibitors :
Major Exhibits :

1. Process Technology / DeviceInkjet, Nano Imprint, Dispenser, Laser Aberration, Laser Transcription, Gravure Printing (includes gravure offset printing), Screen Printing (includes rotary screen printing), Flexo Printing, Transcription Printing, Roll to Roll Pattern Formation, Photolithography, Microscopic Pattern Photolithography Device, Coating Technique (wet coat process, dry coat process such as distillation/spattering, spot coating), Dry/Stiffen/Baking Device, (UV rays, electron beam, and far-infrared radiation), Heat Laminate Device, Device Related to Surface Treatment

2. MaterialElectroconductive Material, Semiconductor Material, Dielectric Material, Nonconductive Material, Metallic Nano Particle, Oxide Semiconductor, Electroconductive Ink, Nonconductive Ink, Inkjet Ink, Metallic Colloid, Organic EL, Color Filter, Board for distribution, Encapsulation Material, Barrier Material, Flexible Substrate, Transparent Electroconductive Film, Functional Film, Optical Stiffened Material, Photoelectric Conversion Material, Photocatalyst

3. Device & ComponentOrganic TFT, Organic EL, Inorganic Electronic luminescence, LCD, Electrocataphoresis, Electronic Paper, Wearable Display, POP Display, Solar Battery, Fuel Cell, Capacitor, Lighting, Sensor, Flexible Speaker, Flexible Actuator, Antenna Module, Smart Packaging, Thin-Film Transistor, Organic Transistor, FPC, Passive Built-in Substrate, Ceramic Condenser, Optical Circuit/Optical Communication Device, Interconnect, RFID, Printed Memory, Printed Tag, Electromagnetic Shield Film, Modulated Light Control Film, Smart Label

4. Measurement / Evaluation / Analysis DeviceSurface Defect Examination Device, Film Thickness Meter, Film Defect Examination Device, Contact Angle Measurement Device, Various Electronic Microscope, Transmissivity Measurement Device, Film Thickness Unevenness Analysis Device, Organic EL Brightness Evaluation System, Phase Difference Weighing Device, Polarization Device, Brightness Measurement Device, Illuminance Measurement Device, Chromaticity Measurement Device, Ritadation Measurement Device, Spectroscopic Ellipsometer, Spectroscopic Interference Film Thickness Measurement Device
Introduction :

University laboratories requesting 2 or more booths will receive one booth free of charge, and the price for national research institutes and public organizations will apply to the second and succeeding booths.

The above exhibition fee does not include the cost for installation & dismantling, decoration, booth cleaning & disposal and the charges for electricity/water supply and drainage/telephone.
Keywords :
 
Contact
Title Show Manager Name
Telephone +81-3-3861-3858 Fax +81-3-3861-3894
E-mail printable@ctiweb.co.jp
Address 3-4-6, Iwamotocho, Chiyoda-ku
City/State Tokyo Country Japan
Comment